SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

L Meng,C.S Bhatia,D Nagalingam,A.G Street,J.C.H Phang

doi:10.1109/irps.2010.5488781

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

L Meng, C.S Bhatia + Show 3 more

https://doi.org/10.1109/irps.2010.5488781

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Publication Date: Jan 1, 2010

Citations: 13

Affiliation: National University of Singapore, Qualcomm (United States)

#Defects In Solar Cells #Scanning Electron Acoustic Microscopy + Show 8 more

Abstract
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Abstract

Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways.

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