Abstract
The goal of atom probe specimen preparation is to produce a needle-shaped specimen with an end radius of less than 50 nm on a smooth uniform shank with a taper angle of less than 5°. Neither the microstructure nor the solute distribution should be altered during fabrication. Traditionally, electropolishing has been the dominant method for producing these needles. Focused ion beam (FIB) instruments enable specimens to be fabricated from a wider range of materials and different forms [1].
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
