Abstract

ABSTRACT Polycrystalline chalcopyrite CuGaS2 thin films were prepared using a spray pyrolysis route has been considered a potential material for the solar cell absorber layer. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) studied the impact of substrate temperature in the range of 200–300˚C on surface profile and roughness. Powder X-ray diffraction disclosed that the films were polycrystalline at all examined substrate temperatures, with crystallite size increasing with increased substrate temperature. The UV-Vis displays the cut-off wavelength in 550–880 nm for varied substrate temperatures of CuGaS2 thin films, and the observed band gap is 2.75 eV–1.89 eV. The electrical attributes showed the enhancement in mobility (4.632 cm2 V−1 s−1) for varied substrate temperatures of CuGaS2 thin films. The 300˚C temperature sprayed CuGaS2 polycrystalline films are a decent candidate to be apposite as an absorber layer in thin film photovoltaic solar cells.

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