Screening and discovery of phosphors by the single-particle-diagnosis approach

Abstract

Discovery of new phosphors becomes an endless topic with great advances in light sources and emissive displays. Traditional trial-and-error methods are time-consuming and inefficient, and innovative approaches are, therefore, required for speeding up the materials discovery. In this paper, the single-particle-diagnosis approach, a novel materials screening method based on single crystal x-ray diffractometry and single-particle luminescence, will be introduced. The concept of this approach is first interpreted, followed by presenting the crystal structure and photoluminescence of newly discovered nitride phosphors. Finally, future perspectives of the single-particle-diagnosis approach are demonstrated.