Abstract

Eu2O3-doped tellurite glasses (15WO3–5Al2O3–80TeO2) were fabricated and their scintillation characteristics were investigated. Typical emissions originating from the 4f→4f transitions of Eu3+ were observed at 580, 592, 614, 653, and 702 nm when irradiated with visible light. The quantum yield of the Eu2O3-doped glass increased as the Eu2O3 concentration increased, and the 5.0% Eu2O3-doped glass exhibited the largest quantum yield of 76%. Further, scintillation originating from the 4f→4f transition of Eu3+ was also detected under X-ray irradiation, and the integrated scintillation intensity depended on the quantum yield. The afterglow levels of the glasses decreased with increasing the Eu2O3 concentration, and the level of the 5.0% Eu2O3-doped glass was 193 ppm, which was close to that of the Tl-doped CsI.

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