Abstract
We have analyzed the scintillation characteristics such as light yield and decay time and the radiation damage of Ce-doped Bi4Si3O12 (BSO) single crystals grown by the vertical Bridgman method. Ce was doped into BSO at 0.1, 0.2 and 0.4 at.% and the grown crystals were analyzed. For the Ce doping at 0.1 at.%, the light yield decreased by 40% while the average decay constant decreased by 20% (from 105 ns to 86 ns). Radiation damage was assessed by measuring the optical transmittance before and after irradiating the crystals with 60Co γ-rays for a maximum accumulated dose of 107 rad. Significant improvement was found for the radiation hardness of Ce-doped BSO.
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