Abstract
The state‐of‐the‐art detector for digital radiography, the flat‐panel detector (also know as the active matrix flat‐panel imager), requires more gain to improve its performance at typical fluoroscopy — real time x‐ray imaging — exposure rates. It has been shown that avalanche multiplication gain in amorphous selenium (a‐Se) can provide the necessary amplification. This amplification, however, must also make little or no contribution to the noise. To achieve this using avalanche gain the intrinsic noise of avalanche multiplication must be reduced. Theoretical calculations and experiments examining the noise properties of an imaging system implementing avalanche multiplication in a layer of a‐Se are presented. The results indicated that avalanche multiplication in a‐Se can have the potential to improve the performance of flat‐panel detectors in fluoroscopy.
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