Abstract
We investigate two-stage assembly flow shop problems (TAFSP) with considering machines breakdown and minimisation of the expected the weighted sum of makespan and mean of completion time is as objective value. This problem is NP-hard, hence we presented genetic algorithm (GA) and new self adapted differential evolutionary (NSDE) for solving random generated test problems. Artificial neural network (ANN) is applied to set parameters of two proposed algorithms also Taguchi method is used for analysing the effect of parameters of problem. The computational results reveal that NSDE is better than GA and achieve to good solutions in a shorter time.
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