Abstract
An electrical failure was detected in an SMD capacitor. Visually, no defect was apparent. By the careful sequential grinding down of a metallographical cross-section through the capacitor, two discoveries were made: A stress crack running obliquely away from the end edge of the capacitor, downwards into the body of the component, and an agglomeration of the Ag/Pd electrode material of the same order of size as that of the distance between the electrodes.
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