Abstract
Solid/solid interfaces can be imaged in the transmission electron microscope by means of refraction/reflection arising from the difference in mean electrostatic potential between the two adjoining solids. Standard approximations used in high energy electron diffraction and microscopy are not directly applicable to treatment of this effect. Two modified procedures are discussed: an adaption of the integral expression for the scattering amplitude and a modified thin phase object approximation. Calculations of diffraction patterns and in-focus contrast from an abrupt interface are shown as examples.
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