Abstract
A model has been used to fit the bidirectional reflectance distribution function for a variety of samples with different angles of incidence and degrees of contamination and roughness by the proper adjustment of six parameters. Exponential and Gaussian composite surface height autocorrelation functions are used to simulate the data at the small and medium angles, and a perturbation of these functions with two additional parameters allows the fit of the upward and downward curve portions of the data at the large angles. Good agreement is found with previous results. The present approach is the same as the classical dispersion equation in treating the index of refraction of optical materials.
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