Scattering contrast of X-ray radiation

Abstract

It is experimentally established that, in the majority of cases, the X-ray radiation scattered on different constituent parts of a weakly absorbing object provides sufficient information on inner structure, different types of structural inhomogeneities, and morphological characteristics, such as shapes, sizes, and location of invisible defects of the object. In this study, a new method for investigation of the inner structure of noncrystalline materials is developed. The method is based on recording of the scattered X-ray radiation. It is demonstrated that the image contrast, formed by the X-ray radiation scattered on weakly absorbing objects, can be considerably higher than the absorption contrast.