Abstract
Scattering characteristics of monolayer and multilayer dielectric periodic structure composed of left-handed materials (LH-DPS) with plane wave arbitrary oblique incidence are carefully analyzed using a method which combines multimode network theory with the rigorous mode matching method. Our analysis results reveal that the arbitrary oblique incident angles and relative position between different LH-DPS have great effects to the scattering characteristics of LH-DPS which different from the situation of dielectric periodic structure composed of right-handed materials (RH-DPS). The reasons why the reflection characteristics of the LH-DPS are totally different from those of the RH-DPS with arbitrary oblique incidence are also given. The present quantitive investigation provides guidelines for the design of the monolayer and multilayer dielectric frequency selective surfaces for millimeter wave applications.
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