Abstract
We calculate the resistivity due to scattering by dipole loops parallel and by dipole lines perpendicular to the interface of a conducting film on a dielectric substrate. This model may serve as a rough description of scattering by certain types of dislocations and corresponding misfit geometries. We give a number of general rules for the choice of materials to minimize this contribution to the total resistivity.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
