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Abstract
Scattered light due to excited surface plasmon in arachidic acid (C20) Langmuir–Blodgett (LB) ultrathin films on the silver (Ag) thin films was measured to obtain information about surface roughness of the films. The scattered light intensities were assumed to be described by a linear superposition of roughness spectra, and the experimental angular distributions were explained by some pairs of the transverse correlation length σ and the surface corrugation depth δ. The angular spectra strongly depended on the roughness parameters, σ and δ. The roughness parameters for the C20 LB films were decided by fitting the theoretical angular patterns to the experimental results. The angular spectra varied with the number of the C20 LB monolayers on the Ag films. It is suggested that the surface roughness of the C20 LB films changed with the number of monolayers. The scattered light method is useful for evaluating surface roughnesses of LB ultrathin films.
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