Abstract
The increase in surface conductivity upon illumination of semi-insulating GaAs was used to enable surface-topography measurements with a scanning tunneling microscope (STM). Images were recorded in ultrahigh vacuum and in air using a HeNe laser and a halogen lamp for the generation of a photoconductive top layer. From the current-voltage characteristics of the tip-sample contact the maximum feedback-controlled tunnel current at a given voltage can be deduced. A calculation of the increase in carrier density and conductance upon illumination is given, which confirms the possibility of using STM on highly resistive photoconductive materials. Further implications and applications are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
