Abstract
The use of scanning tunneling microscopy (STM) for atomic scale characterization of clean and adsorbate covered (single-crystalline) metal surfaces is discussed. Topographic images reveal details on their periodic structure and on the atomic arrangement in the surface layer, and in particular on surface defects. The observation and characterization of individual adsorbate species gives access to the local electronic structure of the adsorption complex and to details of the chemical bond between substrate and adsorbate. Atomic resolution imaging opens new perspectives for the investigation of various surface processes such as surface diffusion, thin film growth or surface reactions.
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