Abstract
We have investigated single electron tunneling in Co–Al–O and Cu–Al–O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current–voltage (I–V) curves are clearly observed even at room temperature in both films. For the Co–Al–O film, furthermore, negative differential conductance appears in the Coulomb staircase.
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