Abstract
This paper covers, in this workshop, the part related with Tunneling Microscopy; i.e. Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). The lectures give a review of the field, but these notes will be more limited to the application of magnetic materials. The version of AFM in magnetism is known as the Magnetic Force Microscopy (MFM). Therefore we present STM applied to polarized electrons and some MFM results applied to recent experiments in magnetic materials and to high temperatures superconducting materials. However there are excellent reviews and comprehensive books that we reference and the reader can follow any specific field with the references quoted.
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