Abstract
A scanning transmission electron microscope (STEM) is used to examine the structural and chemical quality of the interface between thin films of YBa2Cu3O7−δ (YBCO) and BaF2. The STEM images indicate that it is possible to grow a uniform thin film of BaF2 that is relatively free of gross defects via a thermal evaporation method on top of a YBCO thin film. The diffraction contrast results also suggest that a three-dimensional or “island” growth mechanism is involved in BaF2 films grown by this method. An oxygen map across the YBCO/BaF2 interface produced using core loss energy filtered imaging is used to address a concern regarding oxygen diffusion from YBCO into BaF2. It was found that a good quality BaF2 film can play a significant role in reducing outdiffusion of oxygen from YBCO. Quantitative evaluation of the specimen oxygenation suggests that beam spreading effects may be important. The effect of an ultra-high vacuum (UHV) STEM environment on the specimen oxygenation is also considered.
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