Abstract
Scanning Thermal Microscopy (SThM) is a scanning probe technique that allows the mapping of the thermal properties and/or temperature of a substrate. Developments in this scanning probe technique are of great importance to further the study of thermal transport at the micron and at the nano scale, for instance to better the understanding of heat transport in nano-electronic devices or energy transfer in biological systems. Here we describe: 1) the scanning technique developed to acquire simultaneous images of the topography, the thermal and electrical properties of the substrate using a commercially available Veeco SThM probe; 2) how the SThM probe was modified by mounting a micron-sized diamond pyramid on its tip in order to improve the probe's lateral resolution and the topography resolution tests on the performance of the modified probe.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.