Abstract
A new scanning probe microscope based on a scanning tunneling microscope (STM) and a frequency shift of an AT cut quartz resonator has been developed. The quartz resonator coupled to a STM sample is oscillated at its resonance frequency. The shift of the resonance frequency corresponds to the strength of the shearing stress in the sample, and is caused by the shearing force interaction between the STM tip and the sample under the tip scanning. The preliminary images presented show simultaneously STM surface topographies and the changes of subsurface shearing stresses in gold thin films. The sensitivity of our microscope is 0.30 N/m for a 0.2-Hz frequency shift of the quartz crystal resonance frequency.
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