Abstract
The image formation in scanning tunneling microscopy (STM), atomic force microscopy (AFM), and the particularities of imaging supported carbon nanotubes by STM and AFM are discussed. The milestones of STM, STS, and AFM measurements on carbon nanotubes are briefly reviewed. Scanning tunneling spectroscopy (STS) measurements, and atomic resolution images of single-wall and multi-wall carbon nanotubes supported on graphite are compared to typical data for graphite.
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