Abstract

Scanning probe microscopy (SPM) is a branch of microscopy allowing characterization of surfaces at the micro-scale by means of a physical probe (with a size of a few microns) raster scanning the sample. SPMs monitor the interaction between such probe and the surface and, depending on the specific physical principles causing the interaction, they allow generation of a quantitative map of topographic properties: geometrical, optical, electrical, magnetic, etc. This is of the greatest interest, in particular whenever functional surfaces have to be characterized in a quantitative manner. The present paper discusses the different applications of Scanning Probe Microscopy techniques for a thorough characterization of polymer surfaces, of specific interest in particular for the case of food packaging applications.

Highlights

  • Scanning probe microscopy (SPM) refers to a family of techniques which allow imaging of surfaces with nanometric resolution thanks to the implementation of a sharp tip scanned across a sample interface [1]

  • The present paper discusses the different applications of Scanning Probe Microscopy techniques for a thorough characterization of polymer surfaces, of specific interest in particular for the case of food packaging applications

  • Tip-sample vertical interaction force can be converted into a relative vertical elevation, while lateral forces are useful for reconstruction of local friction in the so called Lateral Force Microscopy (LFM) [4] (Figure 1A)

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Summary

Introduction

Scanning probe microscopy (SPM) refers to a family of techniques which allow imaging of surfaces with nanometric resolution thanks to the implementation of a sharp tip scanned across a sample interface [1]. Optical information at the nanoscale can be monitored, through Near-field Scanning Optical Microscopy (NSOM) [6] (Figure 1D). Such technique enables non-diffraction limited imaging and spectroscopy of surfaces thanks to implementation of a small aperture between the light source and the sample surface and the generation of an evanescent field emanated from the aperture in the near-field. The present paper deals with the applications of Atomic Force Microscopy (AFM), High Temperature Atomic Force Microscopy (HT-AFM), Atomic Force Acoustic Microscopy (AFAM), Lateral Force Microscopy (LFM) and Near-field Scanning Optical Microscopy (NSOM) to polymer film characterization, highlighting the applicative potential for food packaging analyses

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