Abstract
Plasmonic antenna probes have been widely investigated for detecting electrical permittivity changes on the nanometer scale by employing high-sensitivity localized surface plasmon resonance (LSPR). Although it is intuitive to integrate such a probe onto an atomic force microscope (AFM) to add one more measurable quantity to the family of scanning probe microscopy techniques, the strong scattering background of the AFM tip overwhelms the LSPR scattering signal. To solve this problem, we combined evanescent coupling, polarization and spatial filtering, confocal spectroscopy, and numerical methods to extract clean LSPR spectra from a gold nanosphere-antenna probe attached to the tip of a fiber taper. By mounting the fiber taper on a custom quartz-tuning-fork SPM, we achieved high-quality nanometer-scale imaging of gold nanospheres on glass slides by mapping the LSPR wavelength shift. In addition, we reported an LSPR wavelength shift enhancement by more complicated probe designs and the consequent promise for higher-sensitivity microscopy. Our optical system and spectral processing method provide an effective solution to the long-standing quest for LSPR scanning microscopy.
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