Scanning probe microscopy applied to the study of domains and domain walls in a ferroelectric KNbO<sub>3</sub> crystal

Abstract

A commercial Atomic Force Microscope (AFM) and a semi-home made Scanning Near-Field Optical Microscope (SNOM) have been used to characterize electrically, topographically and optically the domain walls among natural ferroelectric domains in a KNbO 3 crystal. The AFM measurements have been performed with a metallic coated tip in order to detect electrostatic forces between the polarization field at the ferroelectric surface and the tip. An external electric field has also been applied between the sample surface and the tip to tune this electrostatic interaction over the atomic forces. In optical transmission images, acquired under near field conditions, we observe a clear contrast of the signal at the domain walls between 180° spontaneous polarization domains; while the images of the surface topography, obtained simultaneously, show a reasonably flat surface of the crystal. The scanning probe microscopy techniques used in this work are valuable tools for the investigation of ferroelectric materials and, in particular, to characterize the domain walls, without needing a either especial preparation or damage of the sample surface.