Abstract
A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.
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