Abstract
The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the enhancement when approached close to shear-force distance. However, sharp uncoated tips continue to show up the near-field enhancement, and chemical contrast on rough surfaces continues to be of basic value at submicroscopic resolution. It is pointed out how a good tip may be immediately differentiated from a broken one. Copyright © 1999 John Wiley & Sons, Ltd.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
