Abstract
One of the fundamental aims of scanning gate microscopy is to measure local properties of high-mobility two-dimensional electronic systems. Here, the authors present a study which sheds light on the invasiveness of the scanning probe. The two-dimensional system is shaped into a ballistic cavity, which progressively concentrates the local density of states in order to study the transition from weakly to strongly invasive measurements. A good agreement between experiment and theory allows for the identification of the imaging mechanisms according to the strength of the tip potential. The insights gained lead to a deeper understanding of weakly invasive scanning gate imaging.
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