Abstract

Abstract In this article, referring to specific examples, we demonstrate how recent advances in scanning force microscopy (SFM) have enabled better understanding of structural complexity and responsive behavior of nanostructured polymer materials under external stimuli. The central focus lies on the SFM application toward the analysis of block copolymer thin films with the emphasis on the quantitative information regarding the structural, material, and dynamic characteristics that can be derived from SFM measurements. The examples include quantitative measurements of characteristic spacings with subnanometer resolution, analysis of defect structure and annihilation dynamics, as well as SFM‐based tomographic reconstruction of the inner structure with high depth and lateral resolution. Finally, a perspective of SFM in accessing the responsive properties of soft polymer‐based materials is addressed.

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