Abstract
ABSTRACTHigh purity silica sand is an important commodity used for the processing of photovoltaic silicon for solar cells. The sand must meet very closely defined specifications related to its impurity content and particle size distribution. Scanning Electron Microscopy (SEM) is one of essential techniques used to characterize trace amounts of impurities and their distribution within individual sand particles. The objective of this work is to characterize the impurities present in high purity sandstone silica sand withdrawn from a deposit site located in southern part of Libyan Desert called Al-Shibat using imaging and analytical capabilities of SEM.
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