Abstract
The parameters of functions used to predict diffusion-controlled scanning electrochemical microscopy approach curves under positive and negative (hindered diffusion) feedback for sphere-cap tips are reported. These functions were obtained by fitting approach curves simulated with an error-bounded adaptive finite element algorithm. Several geometries corresponding to different sphere-cap dimensions were considered including the effect of the tip insulating sheath. The simulated approach curves were successfully compared with experimental ones obtained with mercury sphere caps electrodeposited onto platinum microdisk electrodes.
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