Abstract
Local electrochemical impedance spectroscopy (LEIS) has been a versatile technology for characterizing local complex electrochemical processes at heterogeneous surfaces. However, further application of this technology is restricted by its poor spatial resolution. In this work, high-spatial-resolution LEIS was realized using scanning electrochemical cell microscopy (SECCM-LEIS). The spatial resolution was proven to be ∼180 nm based on experimental and simulation results. The stability and reliability of this platform were further verified by long-term tests and Kramers-Kronig transformation. With this technology, larger electric double-layer capacitance (Cdl) and smaller interfacial resistance (Rt) were observed at the edges of N-doped reduced graphene oxide, as compared to those at the planar surface, which may be due to the high electrochemical activity at the edges. The established SECCM-LEIS provides a high-spatial approach for study of the interfacial electrochemical behavior of materials, which can contribute to the elucidation of the electrochemical reaction mechanism at material surfaces.
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