Abstract
A scanning image observation device has been developed for use in conjunction with the JEM-100B Electron Microscope, thereby enabling the microscope to function as a high resolution scanning EM in addition to its basic function as a conventioanl high resolution electron microscope. As a result, it is possible to observe three different types of image of the same specimen area; viz, secondary electron images, transmission scanning images and conventional transmission electron microscope images. It is also possible to detect strays and obsorbed electrons, so that, the combined instrument provides a means for obtaining a wealth of information about the specimen.
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