Abstract
A Physical Electronics 595 Scanning Auger Microprobe was used to study etched filaments and transverse sections of variously reacted commercial bronze matrix multifilamentary Nb 3 Sn conductors. Using beams as fine as 100 nm, tin concentration profiles were observed in polished samples. Differences were noted in the shape of the tin gradient as a function of the location of the reacted filaments within the wires. The tin content of the bronze was also measured between pre-reacted filaments in an unreacted composite and found to be about 1 at.% lower than in the large bronze reservoirs. In a Harwell composite with P-poisoned niobium diffusion barriers, P was detectable in the Nb 3 Sn formed on the barrier but not on the filaments.
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