Abstract
We discuss the use of a conducting-tip atomic force microscope (AFM) for the imaging and electrical measurement of chemically derived nanostructures. First, scanning probe microscopy of CdSe and Au nanocrystals bound to a substrate with a self assembled monolayer will be discussed. It is found that imaging in liquids is necessary to avoid removing the nanocrystals. We then address some issues in performing electrical measurements in liquids. In particular, we examine the conducting properties of the AFM tip when imaging a flat surface, highly oriented pyrolytic graphite, in a non-polar liquid, hexadecane. We find that the solvation layers between the tip and the substrate strongly influence the electrical properties.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
