Abstract
In this work, two planar near-field scan-plane reduction techniques are considered and results are presented. It is shown how truncation based on field-intensity contours, instead of simple geometric truncation, can in some cases improve the efficiency of the truncation process. Both techniques are applied to measured data sets, and it is shown how these methods can be used to reduce data-acquisition times, while also assessing the impact of the total acquisition surface reduction on the far-field radiation-pattern integrity.
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