Abstract
The paper applies a scaling-function based multiresolution time domain (MRTD) scheme, in conjunction with an anisotropic perfectly matched layer (APML) for open and PEC-shielded boundary truncations, to analyse various planar millimetre-wave integrated circuits (MICs). Although adding complexity in deriving update equations and extracting MIC characteristics compared with the conventional finite difference time domain (FDTD) method, the MRTD scheme does provide a systematic, constructive, and flexible tool for the analysis of practical planar printed MIC structures. In particular, it is shown that the MRTD scheme is very efficient and requires only about 15% of the computational space and 25% or less of the time needed for the conventional FDTD techniques for all structures investigated in this research.
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