Abstract
The Monte Carlo (MC) approach is used to check the validity of the scaling relationship for the effective critical exponents in thin Ising films. We investigate this relationship not just in the critical region but throughout the crossover to the expected two-dimensional behavior. Our results indicate that this scaling relationship is very well-fulfilled throughout the entire crossover temperature region, as predicted by a previous renormalization group analysis. The two-dimensional universality class of Ising films is confirmed by means of data collapsing plots for plates with increasing L, up to L=100. The evolution of the maximum value of the effective critical exponents with film thickness is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
