Abstract
High-quality thin films of CeAl 3 with preferentially oriented crystal structure have been prepared, allowing unambiguous measurement of the orientation dependence of the magnetoresistance Δρ: a very large anisotropy is observed. When a magnetic field is applied along the crystal c axis, a positive transverse Δρ is exhibited over a much larger region of H and T than is the case with bulk polycrystalline samples. Rondo scattering is diminished in this orientation when T is below 6 R. Two qualitatively different regimes are observed in which Δρ is described by universal functionsof H/T
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