Abstract
High-quality thin films of CeAl 3 with preferentially oriented crystal structure have been prepared, allowing unambiguous measurement of the orientation dependence of the magnetoresistance Δρ: a very large anisotropy is observed. When a magnetic field is applied along the crystal c axis, a positive transverse Δρ is exhibited over a much larger region of H and T than is the case with bulk polycrystalline samples. Rondo scattering is diminished in this orientation when T is below 6 R. Two qualitatively different regimes are observed in which Δρ is described by universal functionsof H/T
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.