Abstract
Industrial plastics are widely used in warfare electromechanical systems to protect the internal electronic circuitry from environmental effects. Depending the purpose of the warfare system, the surface interaction with electromagnetic fields play a key role and the main parameter that determines reflection and the shielding of the electromagnetic fields from material surface is the dielectric constant of the material itself. In this paper, extraction of scalar dielectric constant from electromagnetic reflection measurement using an alternative two standard calibration technique in a low cost aluminum compact chamber is obtained. Calibration technique uses time domain measurements and converts them to frequency domain. Especially in R&D phase of electromechanical integration of warfare systems, this technique is quite useful where the exact values of dielectric constants of planar industrial plastics are not required. Obtained reflection coefficient error level is 0.67dB for 10mm while it reaches 1.62dB for 40mm thickness materials. It is shown that calculated values are in good agreement with the reference measurement method performed by precision airline setup Agilent 85050C.
Highlights
Characterization of dielectric materials can be performed by S parameters using Vector Network Analyzers (VNA)
This paper presents an application of technique which uses only S11 and two calibration standards for error reduction on the extraction of scalar dielectric constant in a low-cost compact screened test chamber [9,10]
A small part from the dielectric plate is machined in a toroid shape to insert in a precision airline setup namely Agilent 85050C coaxial material characterization kit and the dielectric constant is measured averagely between 5 GHz to 15GHz as 2.20
Summary
Characterization of dielectric materials can be performed by S parameters using Vector Network Analyzers (VNA). Gating in the time domain is the most used technique to remove them It requires a careful investigation on the phase shift information of the reference plane. This paper presents an application of technique which uses only S11 and two calibration standards for error reduction on the extraction of scalar dielectric constant in a low-cost compact screened test chamber [9,10]. The advantage of this technique is in simplicity originating from two calibration standards and free-space medium compare to near field medium [11].
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