Abstract

Damage-free transfer of large-area two-dimensional (2D) materials is indispensable to unleash their full potentials in a wide range of electronic, photonic, and biochemical applications. However, the all-surface nature of 2D materials renders many of them vulnerable to surrounding environments, especially etchants and water involved during wet transfer process. Up to now, a scalable and damage-free transfer method for sensitive 2D materials is still lacking. Here, we report a general damage-free transfer method for sensitive 2D materials. The as-transferred 2D materials exhibit well-preserved structural integrity and unaltered physical properties. We further develop a facile TEM sample preparation technique that allows direct recycling of materials on TEM grids with high fidelity. This recycling technique provides an unprecedented opportunity to precisely relate structural characterization with physical/chemical/electrical probing for the same samples. This method can be readily generalized to diverse nanomaterials for large-area damage-free transfer and enables in-depth investigation of structure-property relationship.

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