Abstract
A method of producing high-quality thin films of perovskite manganites utilizing citrate-based aqueous chemical solution deposition is presented. The method is applied to the production of thin films of gadolinium calcium manganite, Gd1−xCaxMnO3 (GCMO). The film quality is verified by x-ray diffraction analysis, electron microscopy, and magnetic measurements. Finally, planar memristors are fabricated using GCMO films, demonstrating the material’s ability to exhibit resistive switching. This underscores its potential for future memristor technologies.
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