Abstract
A program for chemical analysis by energy-dispersive x-ray spectrometry is described. Fluorescent multiplets are fitted to a high degree of accuracy by a method using an empirical energy-dependent peak-shape function derived from the spectrometer response to well resolved standard sample spectra. Elemental identification is accomplished via an interactive peak search and a complete K and L x-ray line library. Matrix correction routines for element quantification are provided for infinitely thick samples with fundamental parameters, including Compton correction, for thin samples and total reflection (TXRF) geometry and for semi-transparent light matrix pellets (emission-transmission method).
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