Abstract
This study aim to demonstrate dielectric multilayer fabrication with stacked assembly of particles. When a hydrophilic substrate is drawn up from an aqueous suspension in which fine particles are dispersed, monolayer closed-packed or ordered structure can be obtained by utilizing meniscus attraction force between the particles during the process. Repeating this process, different size and material particles can be stacked layer by layer. By changing the permittivity and/or diameters of the particles with layers, the reflectance at particular wavelength light can be increased. Aiming at selective reflection of the near infrared light, silica particles of φ200 nm and titanium oxide particles of φ33 nm were chosen and stack of two layers were fabricated on a silicon substrate. The reflectance was measured with an original setup. Monochromatic light was focused on the sample with various incident angle, and the reflection intensity was measured at specified angle independent of incident angle. Scanning the wavelength of the light, reflection spectrum at specific incident and reflection angle was obtained. It was confirmed that reflectance increased at 1.7 μm when the titanium oxide layer covered on silica layer as derived from theory.
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