Abstract
The purpose of this paper is to outline an approach to routine determination of x-ray detector efficiencies over the entire applicable energy range that may be used on any transmission electron microscope.BACKGROUNDThe quantification of x-ray intensities using the ratio technique can be accomplished [see, for example, 1] using a relation of the form:Here, for element A, CA is the composition in the sample as a weight fraction, kA is the x-ray generation constant (see below) which contains only sample-dependent information, eA is the detector efficiency for characteristic x-rays which contains only detector-dependent information, and lA is the measured x-ray intensity in a characteristic line.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
