Abstract
The thermal roughening of In and Sn microcrystals prepared in an UHV scanning electron microscope is studied in situ by initial growth shape measurements from 300 K to about 10 K below the melting point. On Sn crystals 11 faces could be identified, on In crystals 7 faces. The sequence of the roughening temperatures determined can be correlated with the packing densities of the faces and their surface energies. At present theory is only in partial agreement with experiment.
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