Abstract
Deposition of cadmium sulfide (CdS) thin film on BK7 glass substrates has been prepared by a dry and in situ fabrication process with ion-beam sputtering deposition at room temperature. The structural, optical and electrical properties of CdS thin film were investigated. X-ray diffraction (XRD) analysis indicates the formation of polycrystalline CdS film with the mixed structure of cubic and hexagonal wurtzite phase. The Raman peaks are observed at 304cm−1 and 606cm−1, and these peaks are identified as the first and second order LO optical phonons form of the CdS film. Energy dispersive X-ray Spectrometer (EDS) shows no other impurity elements, except Cd and S. The as-deposited film exhibits good transfer of the sintered target material with almost the same Cd/S ratio. Scan electron microscopy (SEM) and atomic force microscopy (AFM) reveal that the CdS thin film has a smooth surface and exhibited an obvious columnar growth indicating the c-axis preferred orientation. The detected room-mean-square (RMS) roughness by AFM is 0.76nm. Optical transmission and absorption spectroscopy measurement reveal high absorption and energy band gap is of about 2.32eV. The CdS thin film is of n-type conductivity and the resistivity is found to be in the order of 104Ωcm. The CdS films annealed at 100°C were demonstrated to be improvement in structural, electrical and optical properties.
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