Abstract
A series of (Co50Fe50)x-(Al2O3)1−x cermet granular thin films deposited on glass substrates by dual electron beam evaporation was studied for their structural, magnetotransport, and magnetic properties. Upon varying the magnetic volume fraction, x, from 0.07 to 0.52 the percolation threshold (xc) was determined from resistivity measurements to be ∼0.17. This value agrees well with the theoretical prediction for a three-dimensional system of spherical particles. Values of the isotropic tunneling magnetoresistance (TMR) as high as 10% at room temperature were found for films with x<0.16. The relationship between magnetotransport (maximum TMR) and the granular film topology (the percolation threshold) is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
