Abstract

Transmission electron microscopy was employed in a room temperature interdiffusion study of Au/Ga thin film couples. Computer-simulated electron diffraction patterns were used to identify the intermetallic compound Au 2Ga (γ phase) formed in the thin film couples. No other phases were found even after 2 years of room temperature storage. The microstructure of Au 2Ga shows that the compound is formed inside the original large gallium islands and gold is thus identified to be the more rapidly diffusing species. Because of inhomogeneous diffusion over the film surface, large (about 1.5 mm) blisters were formed locally. Furthermore, the interdiffusion-induced stress caused the generation of deformation twins inside the unreacted gold grains.

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